Detection by XRD of hidden defects in epitaxial Bi2Sr2CaCu2O8 thin films grown by PLD

被引：4
|
作者：
Yelpo, Carla [1 ]
Favre, Sofia [1 ]
Ariosa, Daniel [1 ]
机构：
[1] Univ Republica, Fac Ingn, Inst Fis, Herrera & Reissig 565,CC 30, Montevideo 11000, Uruguay
来源：
MATERIALS CHEMISTRY AND PHYSICS | 2020年 / 239卷 / 239期
关键词：
Bi-based cuprates; X-ray diffraction; Intercalar defects; Pulsed laser deposition; SUPERLATTICES;
D O I：
10.1016/j.matchemphys.2019.122020
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
X-ray Diffraction (XRD) analysis of epitaxial Bi2Sr2CaCu2O8 (Bi-2212) thin films grown by Pulsed Laser Deposition (PLD) reveals the presence of the two parent compounds Bi-2201 (calcium free) and Bi-2223 (calcium excess) within the main Bi-2212 phase. These stoichiometric defects are, in many cases, hidden by their dilution as random intercalates within the main matrix. A careful analysis involving subtle Bragg peak deviations with respect to their expected positions in the pure phase and, in some cases, a peculiar signature in the shape of the rocking curves allow us to detect and identify this kind of hidden defects.
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页数：5
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