Properties of transparent conducting quaternary silver indium tin oxide thin films crystallized with delafossite structure

被引：5
|
作者：
Keerthi, K. [1 ]
Nair, Bindu G. [1 ]
Benoy, M. D. [2 ]
Raphael, Rakhy [1 ]
Philip, Rachel Reena [1 ]
机构：
[1] UC Coll, Thin Film Res Lab, Aluva, Kerala, India
[2] Mar Athanasius Coll, Dept Phys, Kothamangalam, Kerala, India
来源：
MATERIALS CHEMISTRY AND PHYSICS | 2017年 / 199卷
关键词：
Thinfilms; Delafossite; Crystallite orientation; Bandgap tuning;
D O I：
10.1016/j.matchemphys.2017.07.058
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A study on crystalline silver indium tin oxide (AISO), a quaternary compound formed by tin incorporation in delafossite AgInO2 is briefed here. X-ray diffraction for structural characterization combined with energy dispersive analysis of X-rays for composition assessment confirms the formation of crystalline thin films with the rhomb-centered rhombohedral delafossite crystalline lattice. The variation in electrical conductivity (101-102 S/cm) and activation energy are correlated with carrier concentration and c axis orientation induced by stoichiometric changes. A band gap tuning from 2.38 eV to 3.23 eV is achieved by the stoichiometry changes. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码：591 / 596
页数：6
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