A spherical rent focusing analyzer for high resolution inelastic X-ray scattering

被引：4
|
作者：
Schwoerer-Bohning, M [1 ]
Abbamonte, PM [1 ]
Macrander, AT [1 ]
Kushnir, VI [1 ]
机构：
[1] Argonne Natl Lab, Adv Photon Source, Expt Facil Div, Argonne, IL 60439 USA
来源：
HIGH HEAT FLUX AND SYNCHROTRON RADIATION BEAMLINES | 1997年 / 3151卷
关键词：
inelastic X-ray scattering; high energy resolution; X-ray optics; synchrotron radiation instrumentation;
D O I：
10.1117/12.294487
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
A new technique for making a high resolution X-ray analyzer is presented. The analyzer consists of a silicon wafer with <111> orientation, a Pyrex glass wafer and a concave polished Pyrex glass substrate. The energy resolution of the analyzer was studied on the inelastic scattering beamline of the Synchrotron Radiation Instrumentation Collaborative Access Team (SRI CAT) on sector 3 of the APS using the Si(777) back reflection at 13.84 keV. Details are presented and compared with other techniques, and we discuss contributions to the measured energy resolution.
引用
收藏
页码：282 / 286
页数：5
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