High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering

被引：11

作者：

Said, Ayman H. ^{[1
]}

Gog, Thomas ^{[1
]}

Wieczorek, Michael ^{[1
]}

Huang, XianRong ^{[1
]}

Casa, Diego ^{[1
]}

Kasman, Elina ^{[1
]}

Divan, Ralu ^{[2
]}

Kim, Jung Ho ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[2] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2018年 / 25卷

关键词：

RIXS; high resolution; analyzer; inelastic X-ray; quartz; CRYSTALS; BACKSCATTERING;

D O I：

10.1107/S1600577517018185

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the Ir L-3 absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr3Ir2O7 sample is shown.

引用

页码：373 / 377

页数：5

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