A parallel algorithm for defect detection of rail and profile in the manufacturing

被引:1
|
作者
Orak, Ilhami Muharrem [1 ]
Celik, Ahmet [2 ]
机构
[1] Karabuk Univ, Muhendislik Fak, Bilgisayar Muhendisligi Bolumu, TR-78050 Karabuk, Turkey
[2] Dumlupinar Univ, Tavsanli Meslek Yuksekokulu, Bilgisayar Teknol Bolumu, TR-43300 Kutahya, Turkey
关键词
Hot rolling processing; defect detection; rail; profile; graphic processor; cuda; parallel processing;
D O I
10.17341/gazimmfd.322168
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Obtaining a result by processing an image via an automatic system may be useful in many fields today. Manufacturing a defective product is an undesired case for manufacturers in many fields. Processing images is an efficient method used to detect defects on images to eliminate the defective products. Since image processing is conducted on pixel basis, it entails great workload. In cases where speed is important in processing, parallel image processing might be a solution. Therefore, processing images in the current multi-core computers by paralleling them with additional hardware and software can boost the performance. The performance in parallel image processing is related to relevance of the algorithm to the parallelism and its accurate distribution to the processors. Common use of the resources and excess of data exchange affect the performance directly. In this study, parallel application of COLMSTD algorithm developed to detect the defects on rail and profile surface during rolling in Kardemir Inc. rolling plant was conducted in two different ways. The 1st method was carried out by selecting the CUDA core numbers in GPU structure by software and the 2nd method was conducted by using single CUDA core. The performance of the results obtained on GPU (Graphics Processing Unit) with the support of CUDA (Compute Unified Device Architecture) interface was compared with that of CPU values.
引用
收藏
页码:439 / 448
页数:10
相关论文
共 50 条
  • [21] The Outlier and Integrity Detection of Rail Profile Based on Profile Registration
    Li, Yanfu
    Zhong, Xiaoyun
    Ma, Ziji
    Liu, Hongli
    IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS, 2020, 21 (03) : 1074 - 1085
  • [22] Rail Surface Defect Detection and Analysis Using Multi-Channel Eddy Current Method Based Algorithm for Defect Evaluation
    Jeong Won Park
    Taek Gyu Lee
    In Chul Back
    Sang Jun Park
    Jong Min Seo
    Won Jae Choi
    Se Gon Kwon
    Journal of Nondestructive Evaluation, 2021, 40
  • [23] Rail Surface Defect Detection and Analysis Using Multi-Channel Eddy Current Method Based Algorithm for Defect Evaluation
    Park, Jeong Won
    Lee, Taek Gyu
    Back, In Chul
    Park, Sang Jun
    Seo, Jong Min
    Choi, Won Jae
    Kwon, Se Gon
    JOURNAL OF NONDESTRUCTIVE EVALUATION, 2021, 40 (03)
  • [24] A Profile Measurement System for Rail Quality Assessment During Manufacturing
    Molleda, Julio
    Usamentiaga, Ruben
    Millara, Alvaro F.
    Garcia, Daniel F.
    Manso, Pedro
    Suarez, Carlos M.
    Garcia, Ignacio
    IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2016, 52 (03) : 2684 - 2692
  • [25] Defect detection in indirect Layered Manufacturing
    Bakhadyrov, I
    Jafari, MA
    Fang, T
    Safari, A
    Danforth, S
    Langrana, N
    1998 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN, AND CYBERNETICS, VOLS 1-5, 1998, : 4251 - 4256
  • [26] Developing Parallel Cracks and Spots Ceramic Defect Detection and Classification Algorithm using CUDA
    Ragab, Khaled
    ALsharay, Nahed
    2017 IEEE 13TH INTERNATIONAL SYMPOSIUM ON AUTONOMOUS DECENTRALIZED SYSTEMS (ISADS 2017), 2017, : 255 - 261
  • [27] Autonomous Rail Surface Defect Identification Based on an Improved One-Stage Object Detection Algorithm
    Wang, Mengyi
    Zhou, Yu
    JOURNAL OF PERFORMANCE OF CONSTRUCTED FACILITIES, 2024, 38 (05)
  • [28] Defect reconstruction algorithm for fabric defect detection
    Fu H.
    Hu F.
    Gong J.
    Yu L.
    Fangzhi Xuebao/Journal of Textile Research, 2023, 44 (07): : 103 - 109
  • [29] Rail Surface Defect Detection Based on Deep Learning
    Li, Xiaoqing
    Zhou, Ying
    Chen, Hu
    ELEVENTH INTERNATIONAL CONFERENCE ON GRAPHICS AND IMAGE PROCESSING (ICGIP 2019), 2020, 11373
  • [30] A Guided Wave Approach to Defect Detection in Switch Rail
    Xu, Xining
    Su, Chaoming
    Yu, Zujun
    Shi, Hongmei
    Zhu, Liqiang
    Gao, Wen
    ADVANCED ENGINEERING MATERIALS, 2023, 25 (20)