A path sensitization technique for testing of switched capacitor circuits

被引：1
|
作者：
Biswas, S [1 ]
Mazhari, B [1 ]
机构：
[1] Carnegie Mellon Univ, Ctr Silicon Syst Integrat, Pittsburgh, PA 15213 USA
来源：
16TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS | 2003年
关键词：
D O I：
10.1109/ICVD.2003.1183111
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
In this work we describe a new method for testing of Switched Capacitor (SC) circuits based on modeling the circuit as a charge transfer graph. Based on the differences between the graphs of good and faulty circuit, one or more paths are identified such that upon their sensitization the difference in output voltage of the good and faulty circuits becomes appreciable. The validity of the proposed technique is demonstrated using the examples of SC lossy integrator, voltage amplifier and biquad filter circuits. It is shown that the proposed technique is efficient in testing both catastrophic as well as parametric faults in the capacitors.
引用
收藏
页码：30 / 35
页数：6
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