Atomic force microscopy tip noise induced by adhesion, nanoindentation and fracture

被引:7
|
作者
Chen, CK [1 ]
Chen, BH [1 ]
Yang, YT [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Mech Engn, Tainan 70101, Taiwan
关键词
D O I
10.1088/0957-4484/15/12/014
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This study performs molecular dynamics simulations in order to clarify the atomic-scale stick-slip behaviour commonly observed when performing surface measurements using an atomic force microscope (AFM). In investigating the surface effects of adhesion, contact deformation, nanoindentation and fracture which occur when a diamond tip interacts with a copper surface, this study considers that both the substrate and the tip deform. The theoretically predicted dynamic behaviour of the AFM cantilever tip includes tip oscillation and noise induced by adhesion, nanoindentation and fracture effects. Molecular dynamics simulations are performed to clarify the atomic-scale friction mechanisms associated with surface deformation and to investigate the dynamic behaviour of the tip during AFM surface measurement. The relative influences of the adhesion, nanoindentation and fracture effects upon the stick-slip phenomenon are investigated.
引用
收藏
页码:1771 / 1778
页数:8
相关论文
共 50 条
  • [21] Tip bluntness transition measured with atomic force microscopy and the effect on hardness variation with depth in silicon dioxide nanoindentation
    Joo Hoon Choi
    Chad Steven Korach
    International Journal of Precision Engineering and Manufacturing, 2011, 12 : 345 - 354
  • [22] Atomic force microscopy and nanoindentation of cement pastes with nanotube dispersions
    de Ibarra, Y. Saez
    Gaitero, J. J.
    Erkizia, E.
    Campillo, I.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2006, 203 (06): : 1076 - 1081
  • [24] Bacterial adhesion measured by atomic force microscopy
    Walker, Asriel
    Peraza, Cindy
    Volle, Catherine
    Ferguson, Megan
    Spain, Eileen
    Nunez, Megan
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 256
  • [25] Microparticle adhesion studies by atomic force microscopy
    Segeren, LHGJ
    Siebum, B
    Karssenberg, FG
    Van den Berg, JWA
    Vancso, GJ
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2002, 16 (07) : 793 - 828
  • [26] Adhesion hysteresis in dynamic atomic force microscopy
    Koeber, Mariana
    Sahagun, Enrique
    Fuss, Martina
    Briones, Fernando
    Luna, Monica
    Saenz, Juan Jose
    PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2008, 2 (03): : 138 - 140
  • [27] A study of adhesion forces by atomic force microscopy
    Jacquot, C
    Takadoum, J
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2001, 15 (06) : 681 - 687
  • [28] Adhesion artefacts in atomic force microscopy imaging
    Paredes, JI
    Martínez-Alonso, A
    Tascón, JMD
    JOURNAL OF MICROSCOPY, 2000, 200 : 109 - 113
  • [29] Theory of microscopic adhesion in atomic force microscopy
    Sasaki, Naruo
    Tsukada, Masaru
    Yosetsu Gakkai Shi/Journal of the Japan Welding Society, 2000, 69 (02): : 68 - 71
  • [30] UNIVERSAL ASPECTS OF ADHESION AND ATOMIC FORCE MICROSCOPY
    BANERJEA, A
    SMITH, JR
    FERRANTE, J
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1990, 2 (44) : 8841 - 8846