Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs

被引：0
|
作者：
Li, Jin-Fu [1 ]
机构：
[1] Natl Cent Univ, Dept Elect Engn, ARES Lab, Jhongli, Taiwan
来源：
ASP-DAC 2005: PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2 | 2005年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
With the increasing demand for high-performance networking application, network components such as network interfaces and routers are built in dedicated hardware modulars. Content addressable memories (CAMs) play an important role in the network components. Testing CAMs is very complicated due to their special structure. This paper presents an efficient March-like test algorithm for detecting the comparison faults of ternary CAMs based on the comparison fault models of binary CAMs. The test algorithm requires 5N Write operations, 2N Erase operations, and (3N+2B) Compare operations for an NxB-bit TCAM.
引用
收藏
页码：65 / 70
页数：6
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