Lattice image of Tl2Ba2CaCu2O8 thin films grown on tilted surface of LaAlO3 substrate

被引：0
|
作者：
Wu, Y
Liu, W
Chen, L
Li, L
机构：
[1] Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China
[2] Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China
来源：
PHYSICA C | 1998年 / 300卷 / 1-2期
关键词：
Tl2Ba2CaCu2O8 thin films; tilted LaAlO3 substrate; transmission electron microscopy;
D O I：
10.1016/S0921-4534(98)00094-X
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The results of a high resolution transmission electron microscopy (HREM) study of epitaxial Tl2Ba2CaCu2O8 (Tl-2212) thin films grown on tilted LaAlO3 (LAO) substrate are presented. The Tl-2212 films were highly epitaxial with c-axis tilted at 21 degrees to the normal of the substrate surface. The superconducting CuO2 planes are parallel to each other, and the thin films are composed of intrinsic Josephson junctions. However, amorphous residual precursor films, second phase particles of Tl2Ba2Ca2Cu3O10 (Tl-2223) and defects of antiphase boundary, stacking faults are observed in the films. (C) 1998 Elsevier Science B.V.
引用
收藏
页码：98 / 104
页数：7
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