A two-step calibration technique for measuring S-parameters of transitional structures

被引:0
|
作者
Li, C [1 ]
Shen, ZX [1 ]
Law, CL [1 ]
机构
[1] Nanyang Technol Univ, Global Positioning Syst Ctr, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
calibration techniques; transitions; vector network analyzer;
D O I
10.1002/mop.10846
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new two-step calibration technique to directly measure the scattering parameters of asymmetrical transnational structures is proposed in this article. This technique conducts two calibrations, each one of them for one type of the transition's two ports and two error boxes asociated with the transition measurement system can then be obtained, with which the transition's raw measured data can be corrected. Experimental studies have verified the validity of the formulation and the accuracy of the two-step calibration technique. The technique can be extensively used to measure the scattering parameters of transitional structures without resorting to constructing back-to-back test fixtures. (C) 2003 Wiley Periodicals. Inc.
引用
收藏
页码:132 / 135
页数:4
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