An efficient diagnosis scheme for random access memories

被引:0
|
作者
Li, JF [1 ]
Huang, CD [1 ]
机构
[1] Natl Cent Univ, Dept Elect Engn, Jhongli 320, Taiwan
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Diagnosis techniques are important for memory yield improvement. This paper presents an efficient diagnosis scheme for RAMs. The diagnosis scheme is composed of three March-based algorithms. A March-15N algorithm is used for locating and partially diagnosing faults of bit-oriented or word-oriented memories, where N represents the address number Then a 3N March-like algorithm is used for locating the aggressor words (bits) of coupling faults in word-oriented (bit-oriented) memories. It also can distinguish the faults which cannot be identified by the March-15N algorithm. Thus the proposed diagnosis scheme can achieve full diagnosis and aggressor location with (15N + 3mN) Read/Write operations for a RAM with m CFs. Subsequently, an adaptive March-like algorithm is also proposed to locate the aggressor bit in the aggressor word with 4log(2)B Read/Write operations, where B is the word width. Analysis results show that the proposed diagnosis scheme has higher diagnostic resolution and lower time complexity than other known fault location and fault diagnosis approaches.
引用
收藏
页码:277 / 282
页数:6
相关论文
共 50 条
  • [21] SEMICONDUCTOR RANDOM-ACCESS MEMORIES
    VADASZ, LL
    CHUA, HT
    GROVE, AS
    IEEE SPECTRUM, 1971, 8 (05) : 40 - +
  • [22] Efficient Incentive Scheme for Wireless Random Channel Access with Selfish Users
    Karouit, Abdelillah
    ADVANCES IN UBIQUITOUS NETWORKING, 2016, 366 : 27 - 38
  • [23] An efficient random access scheme for OFDMA systems with implicit message transmission
    Zhou, Ping
    Hu, Honglin
    Wang, Haifeng
    Chen, Hsiao-Hwa
    IEEE TRANSACTIONS ON WIRELESS COMMUNICATIONS, 2008, 7 (07) : 2790 - 2797
  • [24] A Shared Parallel Built-In Self-Repair Scheme for Random Access Memories in SOCs
    Tseng, Tsu-Wei
    Li, Jin-Fu
    2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2008, : 638 - 646
  • [25] ReBISR: A Reconfigurable Built-In Self-Repair Scheme for Random Access Memories in SOCs
    Tseng, Tsu-Wei
    Li, Jin-Fu
    Hsu, Chih-Chiang
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 18 (06) : 921 - 932
  • [26] Architecting Energy Efficient Crossbar-Based Memristive Random-Access Memories
    Lastras-Montano, Miguel Angel
    Ghofrani, Amirali
    Cheng, Kwang-Ting
    PROCEEDINGS OF THE 2015 IEEE/ACM INTERNATIONAL SYMPOSIUM ON NANOSCALE ARCHITECTURES (NANOARCH 15), 2015, : 1 - 6
  • [27] On-chip testing of random access memories
    Saluja, Kewal K.
    Journal of Electronic Testing: Theory and Applications (JETTA), 1994, 5 (04): : 367 - 376
  • [28] DYNAMIC MEMORIES WITH FAST RANDOM AND SEQUENTIAL ACCESS
    STONE, HS
    IEEE TRANSACTIONS ON COMPUTERS, 1975, 24 (12) : 1167 - 1174
  • [29] ALGORITHM FOR TESTING RANDOM-ACCESS MEMORIES
    KNAIZUK, J
    HARTMANN, CRP
    IEEE TRANSACTIONS ON COMPUTERS, 1977, 26 (04) : 414 - 416
  • [30] RANDOM-ACCESS MACHINES WITH MULTIDIMENSIONAL MEMORIES
    ROBSON, JM
    INFORMATION PROCESSING LETTERS, 1990, 34 (05) : 265 - 266