Postdeposition annealing of pulsed laser deposited CNx films

被引:6
|
作者
González, P [1 ]
Soto, R [1 ]
Lusquiños, F [1 ]
León, B [1 ]
Pérez-Amor, M [1 ]
机构
[1] Univ Vigo, Dept Fis Aplicada, Vigo 36200, Spain
关键词
D O I
10.1116/1.1312372
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A study on the modification of the physicochemical properties of the carbon-nitrogen compounds when submitted to a thermal annealing process is reported. Original films were obtained by ArF laser ablation using organic and inorganic targets in a reactive atmosphere of ammonia or in vacuum conditions. The evolution of the film chemical composition and bonding configuration was followed by controlled thermal effusion, Fourier-transform infrared and energy dispersive x-ray spectroscopies. The thermal energy supplied to the material during the postdeposition annealing of the CN, films promotes the formation of single CN bonds although the film nitrogen concentration decreases by the effusion of hydrogen cyanide, cyanogen, and CN radicals. Additional experiments at different substrate processing temperatures were carried out in order to analyze the role of the temperature on the film properties during the film processing and during postdeposition annealing. (C) 2000 American Vacuum Society. [S0734-2101(00)02506-9].
引用
收藏
页码:3004 / 3007
页数:4
相关论文
共 50 条
  • [1] Structural characterisation of CNx thin films deposited by pulsed laser ablation
    Fuge, GM
    Rennick, CJ
    Pearce, SRJ
    May, PW
    Ashfold, MNR
    DIAMOND AND RELATED MATERIALS, 2003, 12 (3-7) : 1049 - 1054
  • [2] NEXAFS OF PULSED-LASER DEPOSITED BN, CNX, AND GAN FILMS
    TONG, WM
    SHUH, DK
    JIMENEZ, I
    FEILER, D
    WILLIAMS, RS
    CARLISLE, JA
    SUTHERLAND, DGS
    TERMINELLO, LJ
    TREECE, RE
    HORWITZ, JS
    HIMPSEL, FJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1995, 210 : 55 - NUCL
  • [3] Microstructure and tribological behavior of pulsed laser deposited a-CNx films
    Zheng, X. H.
    Tu, J. P.
    Song, R. G.
    APPLIED SURFACE SCIENCE, 2010, 256 (10) : 3211 - 3215
  • [4] Structure, optical and electrical properties of pulsed laser deposited and ion beam deposited CNx films
    Chan, KF
    Zhao, XA
    Ong, CW
    COVALENTLY BONDED DISORDERED THIN-FILM MATERIALS, 1998, 498 : 295 - 300
  • [5] Optical characterisation of CNx thin films deposited by reactive pulsed laser ablation
    Zocco, A
    Perrone, A
    Luches, A
    Rella, R
    Klini, A
    Zergioti, I
    Fotakis, C
    THIN SOLID FILMS, 1999, 349 (1-2) : 100 - 104
  • [6] Characterization of CNx films deposited by pulsed laser ablation using spectroscopic ellipsometry
    Boher, P
    Fogarassy, E
    Szörényi, T
    Antoni, F
    SURFACE & COATINGS TECHNOLOGY, 2002, 151 : 144 - 150
  • [7] Optical characterization of CNx thin films deposited by reactive pulsed laser ablation
    Università di Lecce, Dip. di Fisica, Ist. Nazionale Fisica della Materia, Via per Amesano CP 193, 73100 Lecce, Italy
    不详
    不详
    Thin Solid Films, 1 (100-104):
  • [8] Mechanical and tribological properties of CNx films deposited by reactive pulsed laser ablation
    Zocco, A
    Perrone, A
    Broitman, E
    Czigany, Z
    Hultman, L
    Anderle, M
    Laidani, N
    DIAMOND AND RELATED MATERIALS, 2002, 11 (01) : 98 - 104
  • [9] Cold remote nitrogen plasma effects on pulsed laser deposited CNx films characteristics
    Jama, C.
    Goudmand, P.
    Carbon, 36 (5-6): : 785 - 789
  • [10] Cold remote nitrogen plasma effects on pulsed laser deposited CNx films characteristics
    Jama, C
    Goudmand, P
    FULLERENES AND CARBON BASED MATERIALS, 1998, 68 : 785 - 789