A structural study of effects of NiP seed layer on the magnetic properties of CoCrPt/Ti/NiP perpendicular magnetic films

被引：4

作者：

Sun, CJ

Chow, GM ^{[1
]}

Wang, JP

Soo, EW

Noh, DY

Je, JH

Hwu, YK

机构：

[1] Natl Univ Singapore, Dept Mat Sci, Singapore 119260, Singapore

[2] Data Storage Inst, Singapore 117608, Singapore

[3] Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea

[4] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea

[5] Acad Sinica, Inst Phys, Taipei 11529, Taiwan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2003年 / 199卷

关键词：

X-ray scattering; EXAFS perpendicular magnetic recording;

D O I：

10.1016/S0168-583X(02)01393-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The CoCrPt/Ti/NiP films for perpendicular magnetic recording were studied using X-ray scattering and anomalous X-ray scattering. When the NiP seed layer was used, the long range order of the texture peak of the magnetic film decreased and less Co Was associated with this Bragg order. The structural results were consistent with the observed increased coercivity and decreased magnetization due to the increased magnetic grain isolation caused by the presence of NiP seed layer. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：156 / 160

页数：5

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