Atomic force microscopy of removal of dentin smear layers

被引:11
|
作者
Carvalho Batista, Luiz Henrique
da Silva, Lose Ginaldo, Jr.
Andrade Silva, Milton Fernando
Tonholo, Josealdo
机构
[1] Univ Fed Alagoas, Inst Quim & Biotecnol, BR-57072970 Maceio, AL, Brazil
[2] Univ Fed Alagoas, Fac Odontol, BR-57072970 Maceio, AL, Brazil
关键词
atomic force microscopy; dental surface analysis; smear layer; scaling and root planing; dentinal root surfaces;
D O I
10.1017/S1431927607070419
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The regular periodontal practice of scaling and root planing produces a smear layer on the root surface that is detrimental to the readhesion of tissues during subsequent regeneration therapy. Although it has been demonstrated that gels containing the chelating agent ethylenediaminetetraacetic acid (EDTA) can assist in the removal of this contaminating layer, no quantitative method is yet available by which to evaluate the efficiency of the treatment. In this article, the power of atomic force microscopy (AFM) as a technique for monitoring and mapping the surfaces of dentinal roots is demonstrated. Roughness parameters of teeth that had been scaled and root planed were determined from AFM images acquired both before and after treatment with EDTA. The results confirmed that EDTA is an efficient cleaning agent and that dentinal samples free from a smear layer are significantly rougher than the same samples covered by a contaminating layer. AFM analysis is superior to alternative methods involving scanning electron microscopy because the same sample section can be analyzed many times, thus permitting it to be used as both the control and the treatment surface.
引用
收藏
页码:245 / 250
页数:6
相关论文
共 50 条
  • [41] The Use of Atomic Force Microscopy in Determining the Stiffness and Adhesion Force of Human Dentin After Exposure to Bleaching Agents
    Forner, Leopoldo
    Salmeron-Sanchez, Manuel
    Palomares, Maria
    Llena, Carmen
    Amengual, Jose
    JOURNAL OF ENDODONTICS, 2009, 35 (10) : 1384 - 1386
  • [42] Atomic Force Microscopy
    Bellon, Ludovic
    PHYSICS TODAY, 2020, 73 (05) : 57 - 58
  • [43] Atomic force microscopy
    West, P
    Starostina, N
    ADVANCED MATERIALS & PROCESSES, 2004, 162 (02): : 35 - 37
  • [44] Atomic force microscopy
    Wright-Smith, C
    Smith, CM
    SCIENTIST, 2001, 15 (02): : 23 - 24
  • [45] Atomic force microscopy
    Diaspro, A
    Rolandi, R
    IEEE ENGINEERING IN MEDICINE AND BIOLOGY MAGAZINE, 1997, 16 (02): : 26 - 27
  • [46] Atomic force microscopy
    Damjanovich, S
    Mátyus, L
    CYTOMETRY, 2000, 42 (02): : 128 - 128
  • [47] ATOMIC FORCE MICROSCOPY
    FUJII, T
    YAMADA, H
    NAKAYAMA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (03): : 197 - 197
  • [48] Atomic force microscopy
    Slater, SD
    Parsons, KP
    IMAGING SCIENCE JOURNAL, 1997, 45 (3-4): : 269 - 269
  • [49] Atomic force microscopy
    Musevic, I
    INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2000, 30 (04): : 223 - 227
  • [50] Atomic force microscopy
    Engel, A
    BIOFUTUR, 2001, 2001 (212) : A1 - A5