共 50 条
- [21] In situ measurement and characterization of crystal growth by X-ray diffraction ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2012, 244
- [27] Characterization of strained Si wafers by X-ray diffraction techniques Journal of Materials Science: Materials in Electronics, 2008, 19 : 189 - 193
- [30] Combined Diffraction and Absorption Band Filtration of a Polychromatic X-Ray Spectrum Physics of Wave Phenomena, 2022, 30 : 96 - 103