Highly doped n-type silicon theoretical optimization

被引:0
|
作者
Stem, N [1 ]
Cid, M [1 ]
机构
[1] Univ Sao Paulo, Escola Politecn, Dept Engn Electron, Lab Microelectron, BR-05424970 Sao Paulo, Brazil
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Considering the recent modification of n-type highly doped silicon parameters [1], these work has been made based on one-dimensional models with analytical solutions [2,3]. In order to get a good accuracy, a fifth order approximation has been considered. Passivated emitters with gaussian profile of n(+)pp(+) solar cells were optimized. According to our results. emitter solar cells show their best efficiencies (eta similar or equal to 21.60 - 21.70 %) with N-s = 1 x 10(19) - 5 x 10(18) (cm(-3)) and (1.2 - 2.0)mu M emitter thickness range.
引用
收藏
页码:637 / 642
页数:6
相关论文
共 50 条
  • [31] MEASUREMENT OF HOLE MOBILITY IN HEAVILY DOPED N-TYPE SILICON
    SWIRHUN, SE
    DELALAMO, JA
    SWANSON, RM
    IEEE ELECTRON DEVICE LETTERS, 1986, 7 (03) : 168 - 173
  • [32] THE PHYSICS OF MACROPORE FORMATION IN LOW DOPED N-TYPE SILICON
    LEHMANN, V
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (10) : 2836 - 2843
  • [33] PIEZORESISTANCE AND MAGNETIC SUSCEPTIBILITY IN HEAVILY DOPED N-TYPE SILICON
    SASAKI, W
    KINOSHITA, J
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1968, 25 (06) : 1622 - +
  • [34] ORBACH RELAXATION PROCESS IN HEAVILY DOPED N-TYPE SILICON
    OCHIAI, Y
    MATSUURA, E
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 56 (02): : K109 - K112
  • [35] Highly conductive and highly transparent n-type microcrystalline silicon thin films
    Martins, R
    Macarico, A
    Ferreira, I
    Nunes, R
    Bicho, A
    Fortunato, E
    THIN SOLID FILMS, 1997, 303 (1-2) : 47 - 52
  • [36] ANISOTROPY OF CONDUCTIVITY IN RANTE OF WARM ELECTRONS FOR HIGH-DOPED N-TYPE GERMANIUM AND N-TYPE SILICON
    TSCHULENA, GR
    ACTA PHYSICA AUSTRIACA, 1971, 33 (01): : 42 - +
  • [37] DIFFUSION OF BORON IN HEAVILY DOPED N-TYPE AND P-TYPE SILICON
    WILLOUGHBY, AFW
    EVANS, AGR
    CHAMP, P
    YALLUP, KJ
    GODFREY, DJ
    DOWSETT, MG
    JOURNAL OF APPLIED PHYSICS, 1986, 59 (07) : 2392 - 2397
  • [38] Basal plane dislocation dynamics in highly p-type doped versus highly n-type doped SiC
    Wellmann, Peter
    Queren, Desiree
    Mueller, Ralf
    Sakwe, Sakwe Aloysius
    Kuenecke, Ulrike
    SILICON CARBIDE AND RELATED MATERIALS 2005, PTS 1 AND 2, 2006, 527-529 : 79 - +
  • [39] Synthesis and characterization of porous platinum layers deposited on highly doped N-type porous silicon by immersion plating
    Brito-Neto, Jose Geraldo Alves
    Araki, Shintaro
    Hayase, Masanori
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2006, 153 (11) : C741 - C746
  • [40] ELECTRONIC-PROPERTIES OF HEAVILY-DOPED N-TYPE SILICON
    SELLONI, A
    PANTELIDES, ST
    PHYSICA B & C, 1983, 117 (MAR): : 78 - 80