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- [31] A Novel Gate Driver Approach Using Inductive Feedback to Increase the Switching Speed of Power Semiconductor Devices 2017 19TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'17 ECCE EUROPE), 2017,
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- [34] Simple Gate Charge (Qg) Measurement Technique for On-Wafer Statistical Monitoring and Modeling of Power Semiconductor Devices 2012 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS), 2012, : 98 - 100
- [36] Neural Network-based Classification of Breakdown Mechanisms and Prediction of breakdown Voltage and On-resistance for 4H-SiC Trench Gate MOS Devices 2024 INTERNATIONAL SYMPOSIUM OF ELECTRONICS DESIGN AUTOMATION, ISEDA 2024, 2024, : 780 - 781