Recent Tomographic Imaging Developments at the PSICHE Beamline

PSICHE is a high-energy, multi-technique beamline at the SOLEIL synchrotron facility. It performs X-ray tomography for materials science and other applications and X-ray diffraction for samples at extreme conditions. The beamline has been in service for user experiments since 2013, but is in continual development to add new capabilities. In this article, we present a series of new developments which combine diffraction and tomography and which are of relevance to the study of materials and manufacturing. By combining these techniques, we can add quantitative structural information from diffraction to morphological information obtained by tomography. Recent developments in very fast tomography allow dynamic processes to be studied in situ and in 3D with a time (frequency) resolution of 2 Hz. We have developed in situ sample environments to enable fast tomography measurements at high temperature and pressure, which will allow future studies of industrial processes such as hot isostatic pressing (HIP).