Silicon Wafers; Its Manufacturing Processes and Finishing Techniques: an Overview

被引:7
|
作者
Pandey, Kheelraj [1 ]
Sharma, Ashwani [1 ]
Singh, Ayush Kumar [2 ]
机构
[1] Amity Univ, Amity Sch Engn & Technol, Lucknow Campus, Lucknow, Uttar Pradesh, India
[2] ME Thapar Univ, Patiala, Punjab, India
关键词
Double disk magnetic abrasive finishing (DDMAF); Electrolytic In-Process dressing (ELID); Micro-electrical mechanical system (MEMS); Chemical mechanical polishing (CMP); Chemo-mechanical magneto-rheological finishing (CMMRF); Ball end magneto rheological finishing (BEMRF); VIBRATION;
D O I
10.1007/s12633-022-01940-z
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In today's polishing industry there is a great demand for obtaining a smooth, extremely flat, and mirror-like and particle free surface of silicon wafer for implanting semiconductor devices over it. In this direction, Chemical Mechanical Polishing (CMP) and its allied processes have played a vital role in the present and past scenario. In this paper, glimpses have been presented to highlight the manufacturing processes of silicon wafers and the finishing processes developed by various researchers to get better surface quality of silicon wafers. An alternative to the CMP process a recently advanced method known as double disk magnetic abrasive finishing (DDMAF) along with its chemically allied processes has been also briefed to the polish silicon wafer.
引用
收藏
页码:12031 / 12047
页数:17
相关论文
共 50 条
  • [31] New approach to isotropic texturing techniques on multicrystalline silicon wafers
    Park, SW
    Kim, DS
    Lee, SH
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2001, 12 (11) : 619 - 622
  • [32] New approach to isotropic texturing techniques on multicrystalline silicon wafers
    S. W. Park
    D. S. Kim
    S. H. Lee
    Journal of Materials Science: Materials in Electronics, 2001, 12 : 619 - 622
  • [33] TECHNIQUES FOR CHARACTERIZING DEFECTS IN STARTING SILICON WAFERS USING TSM
    KOYAMA, RY
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (03) : C135 - C135
  • [34] Abrasive-based nano-finishing techniques: An overview
    Jain, V. K.
    MACHINING SCIENCE AND TECHNOLOGY, 2008, 12 (03) : 257 - 294
  • [35] An Overview of Current Research on Simultaneous Double Side Grinding of Silicon Wafers
    Lin, Bin
    Li, Z. C.
    Sun, Wangping
    Zhang, X. H.
    CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2010 (CSTIC 2010), 2010, 27 (01): : 1087 - 1092
  • [36] Manufacturing thermoelectric micro-modules using micromachined silicon wafers
    Li, JF
    Watanabe, R
    Suzuki, H
    Sugimoto, S
    Tanaka, S
    Esashi, M
    PRICM 4: FORTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, VOLS I AND II, 2001, : 2209 - 2212
  • [37] A grinding-based manufacturing method for silicon wafers: an experimental investigation
    Pei, ZJ
    Fisher, GR
    Bhagavat, M
    Kassir, S
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2005, 45 (10): : 1140 - 1151
  • [38] Chemical mechanical planarization of silicon wafers at natural pH for green manufacturing
    Wang, Yong-Guang
    Chen, Yao
    Zhao, Yong-Wu
    INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2015, 16 (09) : 2049 - 2054
  • [39] A CFD simulation platform for surface finishing processes in advanced manufacturing
    Fox, Bud
    Wu, Keni Chih-Hua
    Ma, Shengwei
    Wan, Stephen Yee Ming
    ADVANCES IN ENGINEERING SOFTWARE, 2024, 196
  • [40] The peculiarities of mechanical bending of silicon wafers after diverse manufacturing operations
    Bidadi, H
    Sobhanian, S
    Mazidi, M
    Hasanli, S
    Khorram, S
    MICROELECTRONICS JOURNAL, 2003, 34 (5-8) : 515 - 519