Influence of installation error of grating interferometer on high-precision displacement measurement

被引:9
|
作者
Du, Hao [1 ,2 ]
Zhang, Wentao [1 ,2 ]
Xiong, Xianming [1 ,2 ]
Zeng, Qilin [1 ,2 ]
Wang, Yulin [3 ]
Zhang, Yuting [1 ,2 ]
Xu, Shaohua [1 ,2 ]
Li, Hongyang [1 ,2 ]
机构
[1] Guilin Univ Elect Technol, Dept Elect Engn & Automat, Guilin, Peoples R China
[2] Guilin Univ Elect Technol, Key Lab Optoelect Informat Proc, Guilin, Peoples R China
[3] Yanshan Univ, Sch Informat Sci & Engn, Qinhuangdao, Hebei, Peoples R China
基金
中国国家自然科学基金;
关键词
precision measurement; grating interferometer; installation error; measurement model; WAFER STAGE; ENCODER;
D O I
10.1117/1.OE.60.4.045102
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We investigated a high-precision grating interferometer displacement measurement system that can be applied to high-end immersion lithography machines and explained its composition and measurement algorithm. By analyzing the optical path variation caused by the installation error of the grating interferometer, we calculated the influence of the installation error on the displacement measurement. A displacement measurement model of a grating interferometer using three read heads was established, and the influence of the model coefficients on the displacement measurement model was analyzed. The simulation results show that, under the condition that the error of the measurement model in the X direction and the Y direction is <0.1 nm, the translation error of the read head should be within +/- 100 mu m, and the relative rotation deviation between the two read heads or two gratings placed along the diagonal should be within +/- 50 mu rad. The methods and results of studying the influence of grating interferometer installation error on the displacement measurement provide a theoretical basis for the application of a grating interferometer displacement measurement system in immersive high-end lithography scanners. (C) 2021 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:17
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