Ti 2p soft X-ray emission spectroscopy of Ti2O3

被引:5
|
作者
Sato, H.
Tsuji, K.
Yoshikawa, K.
Tezuka, Y.
Nishimoto, S.
Higashi, M.
Iga, F.
Tsubota, M.
Takemura, M.
Takabatake, T.
Taniguchi, M.
机构
[1] Hiroshima Univ, Hiroshima Synchrotron Radiat Ctr, Higashihiroshima 7390046, Japan
[2] Hiroshima Univ, Grad Sch Sci, Higashihiroshima 7398526, Japan
[3] Hirosaki Univ, Fac Sci & Technol, Hirosaki, Aomori 0368561, Japan
[4] Hiroshima Univ, ADSM, Higashihiroshima 7398520, Japan
[5] JAERI SPring 8, Sayo, Hyogo 6795148, Japan
关键词
Ti2O3; soft X-ray emission spectroscopy; Raman shift; d-d* excitation;
D O I
10.1016/j.elspec.2006.12.050
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Ti 3d electronic structure of Ti2O3 has been investigated by means of soft X-ray photoemission spectroscopy (SXES) in the Ti 2p-3d absorption region. In the SXES spectra, the Raman peaks due to the a(1g)-e(g)(pi) and a(1g)-e(g)(sigma) excitations are observed at 1.3 and 3.3 eV below the incident photon energy, respectively. The intensity of the a(1g)-e(g)(pi) peak in the SXES spectrum measured between the 2P(3/2)-3d and 2p(1/2)-3d absorption peaks depends on the polarization of the incident photon E; the peak observed clearly in case of E parallel to the c-axis, almost disappears in case of E perpendicular to the c-axis. (c) 2007 Elsevier B.V. All rights reserved.
引用
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页码:365 / 368
页数:4
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