Scanning force microscopy of ion-irradiated organic single crystals of benzoyl glycine

被引:14
|
作者
Nagaraja, HS
Ohnesorge, F
Avasthi, DK
Neumann, R
Rao, PM
机构
[1] GSI Darmstadt, D-64291 Darmstadt, Germany
[2] Mangalore Univ, Dept Phys, Mangalagangothri 574199, India
[3] Ctr Nucl Sci, New Delhi 110067, India
来源
关键词
D O I
10.1007/s003390000592
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Single crystals of the amino acid benzoyl glycine (hippuric acid) are irradiated normal to the as-grown surface by highly charged Bi ions with a kinetic energy of 2.38 GeV and a fluence of 1 x 10(10) ions/cm(2). The projectiles create circular craters with a mean diameter of 40 (10) nm on the surface of the crystal as observed by scanning force microscopy (SFM). The mean depth amounts to 4(1)nm, this value bring considered as a lower limit due to the finite radius of curvature of the force cantilever tip. Thus, on the average, each single-ion projectile seems to eject about 10(4) molecules. On the surface of non-irradiated crystals, SFM reveals terraces of a few monolayers in height. In water, it was possible to visualize the lattice periodicity. Terraces were also observed on the irradiated crystal surface in the presence of the craters, indicating that the crystal is still intact at the given dose.
引用
收藏
页码:337 / 341
页数:5
相关论文
共 50 条
  • [31] Ultrasonic measurement of the elastic properties of benzoyl glycine single crystals
    A V Alex
    J Philip
    Pramana, 2004, 62 : 87 - 94
  • [32] QUANTITATIVE SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY OF ORGANIC MATERIALS
    BUTT, HJ
    GUCKENBERGER, R
    RABE, JP
    ULTRAMICROSCOPY, 1992, 46 (1-4) : 375 - 393
  • [33] FIELD-ION MICROSCOPY AND ATOM PROBE ANALYSIS OF ION-IRRADIATED ALLOYS (SUMMARY)
    WOLLENBERGER, H
    KELL, B
    LANG, R
    WAGNER, W
    JOURNAL DE PHYSIQUE, 1989, 50 (C8): : C8335 - C8335
  • [34] NATURE OF P-N CONVERSION OF ION-IRRADIATED INSB CRYSTALS
    BLAUTBLACHEV, AN
    GERASIMENKO, NN
    LEZHEIKO, LV
    LYUBOPYTOVA, EV
    OBODNIKOV, VI
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1980, 14 (02): : 179 - 181
  • [35] SCANNING FORCE MICROSCOPY OF GROWING PROTEIN CRYSTALS
    DURBIN, SD
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1994, 207 : 260 - COLL
  • [36] Nanodimensional changes in the structure of ion-irradiated silicon crystals at a depth exceeding the ion range
    Kiselev, AN
    Levshunova, VL
    Perevoshchikov, VA
    Skupov, VD
    TECHNICAL PHYSICS LETTERS, 2002, 28 (07) : 612 - 614
  • [37] ATOMIC FORCE MICROSCOPY OF ORGANIC CRYSTALS
    Plomp, M.
    Hollander, F. F. A.
    Waizumi, K.
    van Hoof, P. J. C. M.
    van Enckevort, W. J. P.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 166 - 166
  • [38] Nanodimensional changes in the structure of ion-irradiated silicon crystals at a depth exceeding the ion range
    A. N. Kiselev
    V. L. Levshunova
    V. A. Perevoshchikov
    V. D. Skupov
    Technical Physics Letters, 2002, 28 : 612 - 614
  • [39] Fluctuation electron microscopy of medium-range order in ion-irradiated zircon
    Zhao, Gongpu
    Treacy, Michael M. J.
    Buseck, Peter R.
    PHILOSOPHICAL MAGAZINE, 2010, 90 (35-36) : 4661 - 4677
  • [40] Investigations of structural, dielectric and optical properties on silicon ion irradiated glycine monophosphate single crystals
    Kanagasekaran, T.
    Mythili, P.
    Bhagavannarayana, G.
    Kanjilal, D.
    Gopalakrishnan, R.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (15): : 2495 - 2502