Practical technique for measurement of second-order nonlinearity in poled glass

被引：14
|
作者：
Corbari, C [1 ]
Deparis, O [1 ]
Klappauf, BG [1 ]
Kazansky, PG [1 ]
机构：
[1] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England
来源：
ELECTRONICS LETTERS | 2003年 / 39卷 / 02期
关键词：
D O I：
10.1049/el:20030137
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A simple and nondestructive technique for measuring the thickness of the nonlinear optical layer in thermally poled glass, providing a minimum measurable thickness of 4 and 1 mum resolution, is demonstrated. This technique is generally applicable to other nonlinear optical layers as well.
引用
收藏
页码：197 / 198
页数：2
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