Charge contrast imaging of geological materials in the environmental scanning electron microscope

被引:0
|
作者
Watt, GR
Griffin, BJ
Kinny, PD
机构
[1] Curtin Univ Technol, Sch Appl Geol, Tecton Special Res Ctr, Perth, WA 6845, Australia
[2] Univ Western Australia, Ctr Microscopy & Microanal, Nedlands, WA 6907, Australia
关键词
D O I
10.2138/am-2000-11-1221
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
The environmental scanning electron microscope (ESEM) allows high-resolution high-magnification imaging of conductivity differences in uncoated geological samples. Under normal ESEM operating conditions, negative charge buildup at the sample surface (from bombardment by the electron beam) is prevented by the presence of a gas (usually water vapor) in the sample chamber. Backscattered and secondary electrons from the sample ionize this chamber gas, and the resultant positively charged gaseous ions migrate toward the negatively charged sample. When chamber gas pressures lower than approximately 250 Pa are used, however, charging of the sample can occur because insufficient charge balancing positively charged gaseous ions are produced. Charge implantation in the sample alters secondary electron emission, and, because intracrystalline conductivity contrasts occur in response to variations in defect density, secondary electron images reflect compositional variations and/or microstructural features. These secondary electron images are referred to as charge contrast images (CCT). To demonstrate potential geological applications of CCI, we present images of growth zones, microfractures, differential diffusion domains, pleochroic haloes, and relict fluid pathways from zircon (strongly luminescent), quartz (weakly luminescent), and biotite and cordierite (non-luminescent). CCT detect defects in a similar way to cathodoluminescence (CL), but have a higher resolution because the CCI signal is composed of secondary electrons that are generated from a much smaller interaction Volume than photons utilized in CL. CCI imaging also can be applied to a wider variety of geological samples than CL, because electronic charge trapping is not restricted to wide-band gap electronic configurations. One of the most important potential applications of the CCI technique may Lie in the direct imaging of relict fluid pathways in rocks that have experienced metasomatism or alteration.
引用
收藏
页码:1784 / 1794
页数:11
相关论文
共 50 条
  • [21] CONTRAST AND RESOLUTION OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPE IMAGING MODES
    REICHELT, R
    ENGEL, A
    ULTRAMICROSCOPY, 1986, 19 (01) : 43 - 56
  • [22] Energy-filtered imaging in a scanning electron microscope for dopant contrast in InP
    Tsurumi, Daisuke
    Hamada, Kotaro
    Kawasaki, Yuji
    JOURNAL OF ELECTRON MICROSCOPY, 2010, 59 : S183 - S187
  • [23] EQUATIONS OF CHARGE-DISTRIBUTION IN THE ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE (ESEM)
    DANILATOS, GD
    SCANNING MICROSCOPY, 1990, 4 (04) : 799 - 823
  • [24] Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
    Trager-Cowan, C.
    Alasmari, A.
    Avis, W.
    Bruckbauer, J.
    Edwards, P. R.
    Hourahine, B.
    Kraeusel, S.
    Kusch, G.
    Jablon, B. M.
    Johnston, R.
    Martin, R. W.
    Mcdermott, R.
    Naresh-Kumar, G.
    Nouf-Allehiani, M.
    Pascal, E.
    Thomson, D.
    Vespucci, S.
    Mingard, K.
    Parbrook, P. J.
    Smith, M. D.
    Enslin, J.
    Mehnke, F.
    Kneissl, M.
    Kuhn, C.
    Wernicke, T.
    Knauer, A.
    Hagedorn, S.
    Walde, S.
    Weyers, M.
    Coulon, P-M
    Shields, P. A.
    Zhang, Y.
    Jiu, L.
    Gong, Y.
    Smith, R. M.
    Wang, T.
    Winkelmann, A.
    EMAS 2019 WORKSHOP - 16TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS, 2020, 891
  • [25] ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE
    YAMAGUCHI, T
    YANAO, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (04): : 284 - 284
  • [26] NEW CONTRAST MECHANISM FOR SCANNING ELECTRON MICROSCOPE
    WELLS, OC
    APPLIED PHYSICS LETTERS, 1970, 16 (04) : 151 - &
  • [27] IMAGE CONTRAST IN SCANNING ELECTRON MICROSCOPE - REVIEW
    CLARKE, DR
    JOURNAL OF MATERIALS SCIENCE, 1970, 5 (08) : 689 - &
  • [28] CONTRAST IN TRANSMISSION SCANNING ELECTRON-MICROSCOPE
    KANAYA, K
    NISHIKOR.Y
    JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 206 - 206
  • [29] ISOLATION OF POTENTIAL CONTRAST IN SCANNING ELECTRON MICROSCOPE
    OATLEY, CW
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 742 - &
  • [30] AN ANOMALOUS CONTRAST EFFECT IN SCANNING ELECTRON MICROSCOPE
    CLARKE, DR
    STUART, PR
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (09): : 705 - &