Combined k-out-of-n:G, and consecutive kc-out-of-n:G systems

被引：31

作者：

Gera, AE ^{[1
]}

机构：

[1] ELTA Syst Ltd, Qual Management Div, IL-77102 Ashdod, Israel

来源：

IEEE TRANSACTIONS ON RELIABILITY | 2004年 / 53卷 / 04期

关键词：

consecutive k-out-of-n : G; degradation; dependent tests; k-out-of-n : G; mean time to failure; qualification tests; reliability;

D O I：

10.1109/TR.2004.837524

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Qualification tests for a system are normally carried out according to either a k-out-of-n:G scheme, or a consecutive k(c)-out-of-n:G structure. The reliability of a combination of the two systems is evaluated, showing its benefit over each of the individual structures. As expected, the mean time to failure of the combined system is larger than any of them. Generalizations of the analysis are presented for tests with multi-state results, and for dependent tests. Illustrative numerical results are presented to substantiate the theory.

引用

页码：523 / 531

页数：9

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