Visible, EUV, and X-ray spectroscopy at the NIST EBIT facility

被引：0

作者：

Gillaspy, JD ^{[1
]}

Blagojevic, B ^{[1
]}

Dalgarno, A ^{[1
]}

Fahey, K ^{[1
]}

Kharchenko, V ^{[1
]}

Laming, JM ^{[1
]}

Le Bigot, EO ^{[1
]}

Lugosi, L ^{[1
]}

Makonyi, K ^{[1
]}

Ratliff, LP ^{[1
]}

Schnopper, HW ^{[1
]}

Silver, EH ^{[1
]}

Takács, E ^{[1
]}

Tan, JN ^{[1
]}

Tawara, H ^{[1
]}

Tokési, K ^{[1
]}

机构：

[1] NIST, Gaithersburg, MD 20899 USA

来源：

ATOMIC PROCESSES IN PLASMAS | 2004年 / 730卷

关键词：

D O I：

暂无

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry, laboratory astrophysics using an x-ray microcalorimeter, and charge exchange studies using extracted beams of highly charged ions.

引用

页码：245 / 254

页数：10

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