Scaling law for voltage-current curve of a superconductor tape with a power-law dependence of electric field on a magnetic-field-dependent sheet current density

被引:10
|
作者
Li, Shuo [1 ]
Chen, Du-Xing [2 ]
机构
[1] Northeastern Univ, Coll Informat Sci & Engn, Shenyang 110819, Peoples R China
[2] Univ Autonoma Barcelona, Dept Fis, E-08193 Barcelona, Spain
关键词
Voltage-current curve; Superconductor tape; Power-law E(J) relation; Kim model; Scaling law; FLUX-CREEP; AC LOSSES; SUSCEPTIBILITY; CYLINDER; STRIP;
D O I
10.1016/j.physc.2017.05.004
中图分类号
O59 [应用物理学];
学科分类号
摘要
Systematic theoretical study on the voltage (V) vs. current (I) curves of high-T-c superconductor (HTS) thin tapes has not been done till now, although their measurements are frequently used for determining critical current I-c at electric field E equivalent to V/l(v) = E-c = 10(-4) V/m, l(v) being the voltage tap distance. On the other hand, it is well recognized that such tapes obey a power-law dependence of local electric field on local sheet current density with a Kim-model critical sheet current density, from which the V vs. I curve may be calculated as a function of current ramp rate R. Such calculations are carried out in the present work with a scaling law deduced, which states that if E/E-c vs. I/I-c is a solution at given apparent power-law exponent n(a) and R/E-c, then this R/E-c multiplied by a constant C leads to another solution with E/E-c and I/I-c multiplied by C and C-1/na, respectively. In the help of the scaling law, condition-dependent V vs. I may be studied systematically and completely based on a limited amount of numerical computations and V - I curve measurements may be performed under properly controlled conditions to become a more powerful tool for HTS research. (C) 2017 Elsevier B.V. All rights reserved.
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页码:32 / 39
页数:8
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