Soft x-ray magnetic circular dichroism of Cr-doped GaN

被引：3
|
作者：
Makino, H [1 ]
Kim, JJ
Nakamura, T
Muro, T
Kobayashi, K
Yao, T
机构：
[1] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan
[2] Tohoku Univ, Interdisciplinary Res Ctr, Sendai, Miyagi 9808578, Japan
[3] Japan Synchrotron Radiat Res Inst, Mikazuki, Hyogo 6795143, Japan
来源：
CURRENT APPLIED PHYSICS | 2004年 / 4卷 / 06期
关键词：
gallium nitride; x-ray magnetic circular dichroism; ferromagnetism; chromium;
D O I：
10.1016/j.cap.2004.01.031
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Soft X-ray magnetic circular dichroism (XMCD) have been measured for the Ga0.97Cr0.03N film grown by NH3-assisted molecular beam epitaxy. Temperature dependence of the XMCD intensity was well described by the Curie-Weiss law. Although the sample showed ferromagnetic behavior at least up to room temperature, the ferromagnetic component could not be detected by the XMCD measurement. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：615 / 617
页数：3
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