Effects of electric field on recrystallization texture evolution in cold-rolled high-purity aluminum sheet during annealing

The effects of an external DC (direct current) electric field on recrystallization texture evolution in the cold-rolled aluminum sheets with 99.99% purity were investigated by means of X-ray diffraction techniques. The cold-rolled high-purity aluminum sheets were annealed for 60 min at 200, 300 and 400 degrees C, respectively with and without an external DC electric field of 800 V/mm. The results show that with DC electric field, the recrystallization cube texture is strengthened at the stage of grain growth. Possible reason for the strengthening of the recrystallization cube texture with the applied electric field may be attributed to both selected nucleation and selected growth of cube oriented crystal nuclei.