Instrumentation for soft X-ray emission spectroscopy

被引：68
|
作者：
Nordgren, J [1 ]
Guo, JH [1 ]
机构：
[1] Uppsala Univ, Dept Phys, S-72121 Uppsala, Sweden
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2000年 / 110卷 / 1-3期
关键词：
D O I：
10.1016/S0368-2048(00)00154-7
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
An account is presented of developments in instrumentation for soft X-ray emission spectroscopy (SXES) based on synchrotron radiation. An account for grating spectrometers for soft X-ray emission spectroscopy is given, and some considerations regarding synchrotron radiation applications of the spectroscopy are presented. A few points that relate to the new features of resonant SXES and polarization dependent studies are discussed in some detail. A brief discussion on future developments in SXES instrumentation is included. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：1 / 13
页数：13
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