Design of testable reversible latches by using a novel efficient implementation of Fredkin gate

Energy dissipation caused by information loss in irreversible computations will be an important limitation for the development of nano-scale circuits in the near future. Reductions in energy dissipation comprise one of the important goals of nanotechnology-based methods, including Quantum dot Cellular Automata (QCA), and so it is desirable to consider reversibility in the design of QCA circuits. In this research, a novel reversible Fredkin gate based on QCA is proposed, which is more efficient and less complex than the conventional Fredkin gate. Conservative reversible logic is parity preserving; hence, any permanent or transient fault can be caused a mismatch between the inputs and the outputs and can be concurrently detected if a reversible circuit is implemented with the conservative Fredkin gate. A single missing/additional cell defect is investigated in the proposed Fredkin gate and fault patterns are presented. To demonstrate the efficiency of the proposed design, some testable reversible sequential elements, such as D-latch, JK-latch, T-latch and SR-latch, are designed by using it. Our proposed concurrent testable designs greatly reduce the occupied area and maximise the circuit density in comparison with previously reported designs. The proposed designs are simulated and verified using QCA Designer ver.2.0.3 and HDLQ.