Experimental Investigation of the Influence of an Encapsulation Layer on the Lightning Current Characteristics of YBCO Tapes

被引:4
|
作者
Hu, D. [1 ]
Mi, T. Z. [2 ]
He, Y. [1 ]
Li, Z. Y. [1 ]
机构
[1] Shanghai Jiao Tong Univ, Minist Educ, Dept Elect Engn, Key Lab Control Power Transmiss & Convers, Shanghai 200240, Peoples R China
[2] State Grid Ningbo Power Supply Co, Ningbo 315000, Zhejiang, Peoples R China
基金
中国国家自然科学基金;
关键词
YBCO tapes; Lightning current; Encapsulation layer; Degradation; Critical current; Damage types; OVER-CURRENT; HTS TAPES; RECOVERY-TIME; QUENCH;
D O I
10.1007/s10948-017-3990-z
中图分类号
O59 [应用物理学];
学科分类号
摘要
The over-current performance of high-temperature superconductors (HTSs) has been well studied. However, the superconducting devices used in power grids might also suffer from exposure to lightning current. This paper will focus on the influence of the encapsulation layer of YBCO tapes on the performance degradation of the critical current after suffering lightning current. We prepared and tested six groups of samples with different YBCO tape widths, material types of the encapsulation layer, and thicknesses of the encapsulation layer. For comparison, the performance of YBCO tape without an encapsulation layer was also analyzed. The critical current and n value of each sample were measured and calculated before and after 8/20 mu s lightning current tests. Moreover, two types of damage were observed, i.e., surface melt and delamination, and the reasons were described in detail. The results of this paper could provide useful data for selecting the encapsulation layer of YBCO tapes.
引用
收藏
页码:1413 / 1418
页数:6
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