共 50 条
- [24] First-principles approach on atomic-scale origins of dielectric degradation of SiO2 gate insulator NEC Research and Development, 1999, 40 (04): : 414 - 418
- [26] First-principles approach on atomic-scale origins of dielectric degradation of SiO2 gate insulator NEC RESEARCH & DEVELOPMENT, 1999, 40 (04): : 414 - 418