The influence of firing temperature on the electrical and microstructural characteristics of thick-film resistors for strain gauge applications

被引：30
|
作者：
Hrovat, M [1 ]
Bencan, A [1 ]
Belavic, D [1 ]
Holc, J [1 ]
Drazic, G [1 ]
机构：
[1] Jozef Stefan Inst, SI-1000 Ljubljana, Slovenia
来源：
SENSORS AND ACTUATORS A-PHYSICAL | 2003年 / 103卷 / 03期
关键词：
thick-film resistor; gauge factor; microstructure; electrical properties;
D O I：
10.1016/S0924-4247(02)00402-8
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Some commercial 10 kOmega/sq. thick-film resistors based on RuO2, ruthenates or a mixture of RuO2 and ruthenates, were evaluated. The resistors were fired at different temperatures to determine the influence of firing temperature on the electrical and microstructural characteristics. The conductive phase in the resistors (RuO2, ruthenate, and a mixture of RuO2 and ruthenate) was determined with X-ray powder-diffraction analysis. The microstructures of the thick-film resistors were analysed with scanning electron microscopy, transmission electron microscopy and energy-dispersive X-ray analysis. The temperature coefficients of resistivity, noise indices and gauge factors were measured as a function of firing temperature. After long-term high temperature firing (6 h at 950 degreesC) ruthenate transforms into RuO2 coinciding with a significant increase of the temperature coefficients of resistivity. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：341 / 352
页数：12
相关论文
共 50 条
  • [21] STRAIN SENSITIVITY IN THICK-FILM RESISTORS
    CANALI, C
    MALAVASI, D
    MORTEN, B
    PRUDENZIATI, M
    TARONI, A
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1980, 3 (03): : 421 - 423
  • [22] INFLUENCE OF THE SUBSTRATE ON THE ELECTRICAL PROPERTIES OF THICK-FILM RESISTORS.
    Cattaneo, A.
    Pirozzi, L.
    Morten, B.
    Prudenziati, M.
    Electrocomponent Science and Technology, 1979, 6 (3-4): : 247 - 251
  • [23] INFLUENCE OF THE SUBSTRATE ON THE ELECTRICAL-PROPERTIES OF THICK-FILM RESISTORS
    CATTANEO, A
    PIROZZI, L
    MORTEN, B
    PRUDENZIATI, M
    ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1980, 6 (3-4): : 247 - 251
  • [24] INFLUENCE OF THE SUBSTRATE ON THE ELECTRICAL-PROPERTIES OF THICK-FILM RESISTORS
    CATTANEO, A
    PIROZZI, L
    MORTEN, B
    PRUDENZIATI, M
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1980, 3 (01): : 181 - 186
  • [25] Firing, quenching and annealing studies on thick-film resistors
    Vionnet, S
    Maeder, T
    Ryser, P
    JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2004, 24 (06) : 1889 - 1892
  • [26] INFLUENCE OF THE CONTACTS AND FIRING PROCESS ON THE PROPERTIES OF THICK-FILM RESISTORS ON ALUMINA AND DIELECTRICS
    JAKUBOWSKA, M
    PITT, K
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1995, 6 (02) : 75 - 78
  • [27] ELECTRICAL TRANSPORT IN THICK-FILM (CERMET) RESISTORS
    PRUDENZIATI, M
    ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1983, 10 (04): : 285 - 293
  • [28] INVESTIGATIONS OF THICK-FILM RESISTORS WITH HIGH GAUGE FACTORS
    HROVAT, M
    BELAVIC, D
    DRAZIC, G
    HOLC, J
    SOBA, S
    INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 1995, 25 (02): : 108 - 114
  • [29] ELECTRICAL-CONDUCTION IN THICK-FILM RESISTORS
    ABE, O
    TAKETA, Y
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1991, 24 (07) : 1163 - 1171
  • [30] ELECTRICAL MODEL FOR CONDUCTION IN THICK-FILM RESISTORS
    HIMELICK, JM
    VEST, RW
    AMERICAN CERAMIC SOCIETY BULLETIN, 1979, 58 (03): : 363 - 363
12345