Experimental verification of a correlation-based correction algorithm for multi-bit delta-sigma ADCs

被引：2

作者：

Wang, XS ^{[1
]}

Guo, YH ^{[1
]}

Moon, UK ^{[1
]}

Temes, GC ^{[1
]}

机构：

[1] Oregon State Univ, Sch Elect Engn & Comp Sci, Corvallis, OR 97331 USA

来源：

PROCEEDINGS OF THE IEEE 2004 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2004年

关键词：

D O I：

10.1109/CICC.2004.1358874

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A multi-chip system was built to provide experimental verification of a correlation-based digital algorithm, which acquires and corrects all element errors in the internal DAC of a multi-bit delta-sigma ADC. The proposed correction method does not rely on noise shaping, and hence it remains fully effective even for very low oversampling ratios (OSRs). Measured results obtained for OSR = 4 confirmed that a 12 dB SNDR improvement can be achieved using such digital correction, while only 1similar to2 dB with the commonly used mismatch-shaping technique.

引用

页码：523 / 526

页数：4

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