Fabrication of Josephson junctions by using an atomic force microscope

Josephson junctions have been fabricated by using an atomic force microscope (AFM) for surface modification. YBCO films were fabricated on MgO substrates by using pulsed laser deposition. Surface modification of YBCO strips in the field of conductive AFM tips results in controlled and systematic growth of protrusions across the entire strip. Increasing the negative bias voltage to the AFM tip linearly increases the size of the modified structures. The offset superconducting transition temperature and the critical current values systematically shift to lower temperature and current values with increasing degree of AFM modification.