Quasi-free-standing bilayer epitaxial graphene field-effect transistors on 4H-SiC (0001) substrates

被引:23
|
作者
Yu, C. [1 ]
He, Z. Z. [1 ,2 ]
Li, J. [1 ]
Song, X. B. [1 ]
Liu, Q. B. [1 ]
Cai, S. J. [1 ]
Feng, Z. H. [1 ]
机构
[1] Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang 050051, Peoples R China
[2] Hebei Univ Technol, Sch Elect & Informat Engn, Tianjin 300130, Peoples R China
基金
中国国家自然科学基金;
关键词
MAXIMUM OSCILLATION FREQUENCY; GATE;
D O I
10.1063/1.4939591
中图分类号
O59 [应用物理学];
学科分类号
摘要
Quasi-free-standing epitaxial graphene grown on wide band gap semiconductor SiC demonstrates high carrier mobility and good material uniformity, which make it promising for graphene-based electronic devices. In this work, quasi-free-standing bilayer epitaxial graphene is prepared and its transistors with gate lengths of 100 nm and 200 nm are fabricated and characterized. The 100 nm gate length graphene transistor shows improved DC and RF performances including a maximum current density I-ds of 4.2 A/mm, and a peak transconductance g(m) of 2880 mS/mm. Intrinsic current-gain cutoff frequency f(T) of 407 GHz is obtained. The exciting DC and RF performances obtained in the quasi-free-standing bilayer epitaxial graphene transistor show the great application potential of this material system. (C) 2016 AIP Publishing LLC.
引用
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页数:5
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