An etalon-based method for frequency calibration of terahertz time-domain spectrometers (THz TDS)

被引：15
|
作者：
Naftaly, M. [1 ]
Dudley, R. A. [1 ]
Fletcher, J. R. [2 ]
机构：
[1] Natl Phys Lab, TQEM, Teddington TW11 0LW, Middx, England
[2] Univ Durham, Dept Phys, Durham, England
来源：
OPTICS COMMUNICATIONS | 2010年 / 283卷 / 09期
关键词：
SPECTROSCOPY;
D O I：
10.1016/j.optcom.2009.12.025
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present an etalon-based method of calibrating the frequency of terahertz time-domain spectrometers (THz TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air-gaps. The technique provides frequency calibration across the measurement band with uncertainties comparable with the typical THz TDS resolution. Crown Copyright (C) 2009 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码：1849 / 1853
页数：5
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