A high-precision instrument for mapping of rotational errors in rotary stages

被引:14
|
作者
Xu, Weihe [1 ]
Lauer, Kenneth [1 ]
Chu, Yong [1 ]
Nazaretski, Evgeny [1 ]
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
关键词
high-precision instrument; rotational errors; rotary stages; RAY; RESOLUTION;
D O I
10.1107/S160057751401618X
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A rotational stage is a key component of every X-ray instrument capable of providing tomographic or diffraction measurements. To perform accurate three-dimensional reconstructions, runout errors due to imperfect rotation (e.g. circle of confusion) must be quantified and corrected. A dedicated instrument capable of full characterization and circle of confusion mapping in rotary stages down to the sub-10 nm level has been developed. A high-stability design, with an array of five capacitive sensors, allows simultaneous measurements of wobble, radial and axial displacements. The developed instrument has been used for characterization of two mechanical stages which are part of an X-ray microscope.
引用
收藏
页码:1367 / 1369
页数:3
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