The crazy mixed up world of silicon debug

被引：29
|
作者：
Josephson, D
Gottlieb, B
机构：
来源：
PROCEEDINGS OF THE IEEE 2004 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2004年
关键词：
D O I：
10.1109/CICC.2004.1358915
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, we will give an overview of the silicon debug process. We'll discuss the procedure of debug, along with the current state of the art tools and design features used to assist in the process of doing debug. In conclusion, we'll discuss what new challenges lay ahead in the area of silicon debug.
引用
收藏
页码：665 / 670
页数：6
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