Improved probes for scanning near-field optical microscopy

被引：0
|
作者：
Suh, YD [1 ]
Zenobi, R [1 ]
机构：
[1] ETH Zurich, Dept Chem, CH-8092 Zurich, Switzerland
来源：
ADVANCED MATERIALS | 2000年 / 12卷 / 15期
关键词：
D O I：
10.1002/1521-4095(200008)12:15<1139::AID-ADMA1139>3.0.CO;2-8
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Vastly improved fiber probes for SNOM microscopy are the result of a new chemical etching method. The optical fiber's protective polymer coating is left on during the etching process, which gives rise to greatly improved tip surfaces (see Figure, right). The tips have a much higher damage threshold, allowing brighter transmission and opening the door to Raman imaging (e.g. of DNA) and laser ablation.
引用
收藏
页码：1139 / +
页数：5
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