Boundary-scan test realization based on embedded system

被引：0

作者：

Cui Wei ^{[1
]}

Feng Chang-Jiang ^{[1
]}

Mao Zhijun

机构：

[1] Cent Lab Electrician & Elect, Shijiazhuang 050003, Hebei, Peoples R China

来源：

ISTM/2009: 8TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-6 | 2009年

关键词：

Boundary scan; embedded system; state machine; command register;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

For better application of Boundary-Scan technology on modern circuit testing,we have designed Boundary-Scan test system based on embedded system.. The whole system is based on IEEE1149.1 Boundary Scan structure and test access port standard. The system involves Boundary-Scan software based on embedded system and Boundary Scan test instrument. Boundary Scan software based on embedded system make Boundary, Scan test more agile,meanwhile the time of Boundary Scan testing will be shortened because simulation timing is produced by hardware in Boundary-Scan test instrument.

引用

页码：283 / 286

页数：4

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