Boundary-scan test realization based on embedded system

被引：0

作者：

Cui Wei ^{[1
]}

Feng Chang-Jiang ^{[1
]}

Mao Zhijun

机构：

[1] Cent Lab Electrician & Elect, Shijiazhuang 050003, Hebei, Peoples R China

来源：

ISTM/2009: 8TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-6 | 2009年

关键词：

Boundary scan; embedded system; state machine; command register;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

For better application of Boundary-Scan technology on modern circuit testing,we have designed Boundary-Scan test system based on embedded system.. The whole system is based on IEEE1149.1 Boundary Scan structure and test access port standard. The system involves Boundary-Scan software based on embedded system and Boundary Scan test instrument. Boundary Scan software based on embedded system make Boundary, Scan test more agile,meanwhile the time of Boundary Scan testing will be shortened because simulation timing is produced by hardware in Boundary-Scan test instrument.

引用

页码：283 / 286

页数：4

共 50 条

[1] System issues in boundary-scan board test
Parker, KP
INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS, 2000, : 724 - 728
[2] Embedded test technique extends 1149.1 boundary-scan architecture
Desposito, J
ELECTRONIC DESIGN, 1999, 47 (24) : 50 - 50
[3] WORKING WITH BOUNDARY-SCAN TEST
BISHOP, L
ELECTRONIC PRODUCTS MAGAZINE, 1993, 35 (10): : 65 - 71
[4] Using boundary-scan test
de Jong, Frans, 1600, (29):
[5] Socillator test: A delay test scheme for embedded ICs in the boundary-scan environment
Tan, TJ
Lee, CL
19TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2001, : 158 - 162
[6] Design for boundary-scan test
Journal of Japan Institute of Electronics Packaging, 2020, 23 (03) : 243 - 247
[7] Working with boundary-scan test
Electronic Products (Garden City, New York), 1993, 35 (10):
[8] BoardFix - An in-circuit test and boundary-scan test system
Xiao, TJ
Zhang, HC
Hu, LA
ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 2, 2005, : 105 - 110
[9] Design and Implementation of Boundary-Scan Test System Based on Network Interface Card
Chen, Shouhong
Huang, Xin
Yan, Xuelong
Lei, Jia
2010 2ND INTERNATIONAL ASIA CONFERENCE ON INFORMATICS IN CONTROL, AUTOMATION AND ROBOTICS (CAR 2010), VOL 1, 2010, : 273 - 275
[10] Boundary-Scan Technology for Chiplet Test
Kameyama S.
Journal of Japan Institute of Electronics Packaging, 2024, 27 (04) : 319 - 324

← 1 2 3 4 5 →