Two-dimensional directional wavelets as a symmetry scanner

被引：0
|
作者：
Antoine, JP [1 ]
机构：
[1] Univ Catholique Louvain, Inst Phys Theor, B-1348 Louvain, Belgium
来源：
PROCEEDINGS OF THE FIRST INTERNATIONAL WORKSHOP ON CONTEMPORARY PROBLEMS IN MATHEMATICAL PHYSICS | 2000年
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D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The analysis of oriented features in images requires 2-D directional wavelets, for instance, in standard tasks such as edge detection or directional filtering. In addition we present here a new application, namely, a technique for determining all the (statistical) symmetries of a given pattern with respect to rotations and dilations. Examples are Penrose tilings, mathematical quasicrystals or various quasiperiodic planar point sets or patterns.
引用
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页码：47 / 60
页数：14
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