共 50 条
- [31] Semiconductor defect characterization in the scanning electron microscope DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1995, 1996, 149 : 171 - 176
- [32] New reference material for transmission electron microscope calibration INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VI, 2012, 8466
- [33] A metrological Scanning Probe Microscope based on a quartz tuning fork detector SCANNING MICROSCOPIES 2011: ADVANCED MICROSCOPY TECHNOLOGIES FOR DEFENSE, HOMELAND SECURITY, FORENSIC, LIFE, ENVIRONMENTAL, AND INDUSTRIAL SCIENCES, 2011, 8036
- [34] Metrological scanning probe microscope based on a quartz tuning fork detector JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2012, 11 (01):
- [35] Advance in dimensional measurements of nano-objects based on defocusing of the electron probe of a scanning electron microscope INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VII, 2013, 8819
- [36] Development of a compact nano manipulator based on an atomic force microscope For monitoring using a scanning electron microscope or an inverted optical microscope 2012 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO), 2012, : 22 - 27
- [37] ON-LINE SCANNING ELECTRON MICROSCOPE/PSEUDO ELECTRON MICROPROBE SYSTEM ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1971, (MAR-A): : 8 - &
- [38] MATERIAL CHARACTERIZATION WITH A SIMPLE LASER-SCANNING MICROSCOPE APPLIED OPTICS, 1993, 32 (32): : 6458 - 6463
- [39] STAINING OF BIOLOGICAL-MATERIAL FOR SCANNING ELECTRON-MICROSCOPE JOURNAL OF MICROSCOPY-OXFORD, 1974, 100 (APR): : 323 - 330
- [40] INVESTIGATION OF MATERIAL POROSITY BY MEANS OF A SCANNING ELECTRON-MICROSCOPE SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1986, 53 (08): : 481 - 483