Fault models and test generation for hardware-software covalidation

被引：16

|

作者：

Harris, IG ^{[1
]}

机构：

[1] Univ Calif Irvine, Sch Informat & Comp Sci, Irvine, CA 92697 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2003年 / 20卷 / 04期

关键词：

D O I：

10.1109/MDT.2003.1214351

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：40 / 47

页数：8

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