Fault models and test generation for hardware-software covalidation

被引：16
|
作者：
Harris, IG [1 ]
机构：
[1] Univ Calif Irvine, Sch Informat & Comp Sci, Irvine, CA 92697 USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2003年 / 20卷 / 04期
关键词：
D O I：
10.1109/MDT.2003.1214351
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：40 / 47
页数：8
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