Measurement of ultra-high-Q photonic crystal nanocavity using single-sideband frequency modulator

被引：9
|
作者：
Tanabe, T. [1 ]
Notomi, M. [1 ]
Kuramochi, E. [1 ]
机构：
[1] NTT Corp, NTT Basic Res Labs, Atsugi, Kanagawa 2430198, Japan
来源：
ELECTRONICS LETTERS | 2007年 / 43卷 / 03期
关键词：
D O I：
10.1049/el:20073773
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The spectral measurement of an ultra-high quality-factor (Q) photonic crystal nanocavity using a single-sideband electro-optic modulator made of lithium niobate is described. This technique provides a simple and powerful way to measure the spectral response of ultra-high-Q cavities that have a Q of 1 million. Such cavities are usually difficult to measure with a tunable laser diode or an acousto-optic frequency shifter.
引用
收藏
页码：187 / 188
页数：2
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