Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory

被引:25
|
作者
Okabayashi, Norio [1 ,2 ]
Gustafsson, Alexander [3 ]
Peronio, Angelo [1 ]
Paulsson, Magnus [3 ]
Arai, Toyoko [2 ]
Giessibl, Franz J. [1 ]
机构
[1] Univ Regensburg, Inst Expt & Appl Phys, D-93053 Regensburg, Germany
[2] Kanazawa Univ, Grad Sch Nat Sci & Technol, Kanazawa, Ishikawa 9201192, Japan
[3] Linnaeus Univ, Dept Phys & Elect Engn, S-39182 Kalmar, Sweden
基金
瑞典研究理事会;
关键词
MOLECULE VIBRATIONAL SPECTROSCOPY; RESOLUTION; CO;
D O I
10.1103/PhysRevB.93.165415
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Achieving a high intensity in inelastic scanning tunneling spectroscopy (IETS) is important for precise measurements. The intensity of the IETS signal can vary by up to a factor of 3 for various tips without an apparent reason accessible by scanning tunneling microscopy (STM) alone. Here, we show that combining STM and IETS with atomic force microscopy enables carbon monoxide front-atom identification, revealing that high IETS intensities for CO/Cu(111) are obtained for single-atom tips, while the intensity drops sharply for multiatom tips. Adsorption of the CO molecule on a Cu adatom [CO/Cu/Cu(111)] such that the molecule is elevated over the substrate strongly diminishes the tip dependence of IETS intensity, showing that an elevated position channels most of the tunneling current through the CO molecule even for multiatom tips, while a large fraction of the tunneling current bypasses the CO molecule in the case of CO/Cu(111).
引用
收藏
页数:6
相关论文
共 50 条
  • [31] Scanning tunneling microscopy and atomic force microscopy on charge density wave and related materials
    Wiesendanger, R
    PHYSICS AND CHEMISTRY OF LOW-DIMENSIONAL INORGANIC CONDUCTORS, 1996, 354 : 229 - 239
  • [32] Dual Binding Configurations of Subphthalocyanine on Ag(100) Substrate Characterized by, Scanning Tunneling Microscopy, Tip-Enhanced Raman Spectroscopy, and Density Functional Theory
    Whiteman, Philip J.
    Schultz, Jeremy F.
    Porach, Zachary D.
    Chen, Hanning
    Jiang, Nan
    JOURNAL OF PHYSICAL CHEMISTRY C, 2018, 122 (10): : 5489 - 5495
  • [33] Inelastic electron tunneling spectroscopy: A route to the identification of the tip-apex structure
    Vitali, Lucia
    Borisova, Svetlana D.
    Rusina, Galina G.
    Chulkov, Evgueni V.
    Kern, Klaus
    PHYSICAL REVIEW B, 2010, 81 (15):
  • [34] Atomic structure of tip apex for spin-polarized scanning tunneling microscopy
    Rodary, G.
    Girard, J. -C.
    Largeau, L.
    David, C.
    Mauguin, O.
    Wang, Z. -Z.
    APPLIED PHYSICS LETTERS, 2011, 98 (08)
  • [35] Inelastic electron tunneling spectroscopy for probing strongly correlated many-body systems by scanning tunneling microscopy
    Eickhoff, Fabian
    Kolodzeiski, Elena
    Esat, Taner
    Fournier, Norman
    Wagner, Christian
    Deilmann, Thorsten
    Temirov, Ruslan
    Rohlfing, Michael
    Tautz, F. Stefan
    Anders, Frithjof B.
    PHYSICAL REVIEW B, 2020, 101 (12)
  • [36] THEORY OF SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY ON SI(100) RECONSTRUCTED SURFACES
    KAGESHIMA, H
    TSUKADA, M
    PHYSICAL REVIEW B, 1992, 46 (11): : 6928 - 6937
  • [38] CHARACTERIZATION OF ULTRATHIN SPUTTERED SIO FILMS ON ALUMINA BY INELASTIC ELECTRON-TUNNELING SPECTROSCOPY AND ATOMIC FORCE MICROSCOPY
    MALLIK, RR
    HENRIKSEN, PN
    BUTLER, T
    KULNIS, WJ
    CONFER, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 2412 - 2418
  • [39] Electronic structure of Si(110)-(16 x 2) studied by scanning tunneling spectroscopy and density functional theory
    Setvin, Martin
    Brazdova, Veronika
    Bowler, David R.
    Tomatsu, Kota
    Nakatsuji, Kan
    Komori, Fumio
    Miki, Kazushi
    PHYSICAL REVIEW B, 2011, 84 (11)
  • [40] Theory of the relation between inelastic scanning tunneling spectroscopy of adsorbates and their vibrational deexcitation
    Mingo, N
    Makoshi, K
    Mii, T
    Ueba, H
    SURFACE SCIENCE, 2001, 482 : 96 - 100