Enhanced Signal-to-Noise Ratio of Ge/Ge1-xSnx/Ge based Multiple Quantum Well Heterojunction Phototransistor for SWIR Photodetection

被引:0
|
作者
Kumar, Harshvardhan [1 ]
Basu, Rikmantra [1 ]
机构
[1] Natl Inst Technol Delhi, Elect & Commun Engn Dept, Sect A-7, New Delhi 110040, India
关键词
GeSn-alloy; heterojunction phototransistors; Multiple Quantum Well; signal-to-noise ratio;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have studied noise characteristics and signal-to-noise ratio (SNR) of n-Ge/p-Ge1-xSnx/n-Ge Heterojunction Transistor (HPT) with multiple quantum well (MQW) inserted in the base and different base-width for efficient detection at 1.55 mu m. The MQW inserted in the base significantly improves SNR in the high-frequency region, leading to efficient detection in the fiber-optic telecommunication windows. The results show that SNR is not only dependent on the frequency, but also on the base-width and number of quantum wells (QWs). The estimated result shows that SNR of >61 dB up to 100 GHz can be achieved, which ensures the operation of the device in the high-frequency range and low-noise detector.
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页数:4
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